To improve the quality of invention/ design patent examination, starting from January 1, 2008, TIPO will include Publication of Referenced Information for Patent Examination in the Patent Gazette. The new measure will: 1) publicize and promote transparency of referenced information used in examination to facilitate the public's understanding and trust for patent examination; 2) enable examiners to completely index the relevant referenced documentation and prudently judge the patentability of applications; 3) the industry can utilize the information related to the technology entailed invention for R&D, circumvent design reference and for associated use of patents, technology independence and for quantitative patent analysis so as to benefit the overall arrangement of patent development and promote the interests of the industry.